The VALID SL in-circuit and functional test system is designed for high-channel-count testing in demanding electronics manufacturing environments. Introduces a cable-free architecture with new 128-channel scanner cards, supporting configurations exceeding 4,480 channels for complex test requirements. Offers an expanded test area with both single-stage and dual-stage configurations and supports multi-job operation through Seica’s latest VIVA software interface. Integrates streamlined internal hardware access. Built to support scalable automation and intelligent test strategies for high-volume and high-reliability applications.

Seica

seica.com

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